To bring researchers together from a wide range of materials backgrounds and disciplines and highlight how these techniques can be successfully applied to solve many materials’ problems.
A series of presentation will be given by invited speakers, expertise in the application of SIMS and ion scattering.
The LIES user meeting is open to all and is a day for researchers who use and are interested in using LEIS. The day will consist of invited speakers and researcher presenting their work.
Event poster (PDF, 1 MB): http://www.iop.org/activity/groups/subject/mc/calendar/files/file_53856.pdf