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Metrology and Characterisation of Nanoparticles

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09:00 – 17:00 28 Jun 2010
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Institute of Physics
W1B 1NT
London
UK

Speakers: Dr. Richard Baker

This one-day meeting will provide a forum for the presentation of recent results and for discussion of how electron microscopy, nanoanalysis, scanning probe, X-ray scattering and related analysis techniques can be applied to more accurately measure the dimensions and properties of nanoparticles.

Event type: Conference
Organised by: Electron Microscopy and Analysis Group of the Institute of Physics
Contact details: Jenny Bremner
jenny.bremner_AT_iop.org

http://www.iop.org/events/scientific/conferences/y/10/metrology/


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Location icon
Institute of Physics
W1B 1NT
London
UK
Clock icon
09:00 – 17:00 28 Jun 2010
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Invite friends
Link copied!