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Microscopy of Semiconducting Materials 2011 (MSM-XVII)

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00:00 4 Apr 2011 – 00:00 8 Apr 2011
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Churchill College
University of Cambridge
Storey's Way
Cambridge
CB3 ODS

Speakers: Dr Thomas Walter

The conference will focus on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the applications of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques including scanning probe microscopy and X-ray topography and diffraction will also be featured. Developments in materials science and technology covering the complete range of elemental and compound semiconductors will be described.

Event type: Conference
Organised by: IOP Electron Microscopy and Analysis Group
Contact details: Conferences Department
Email: claire.garland@iop.org

http://www.msm2011.org


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Location icon
Churchill College
University of Cambridge
Storey's Way
Cambridge
CB3 ODS
Clock icon
00:00 4 Apr 2011 – 00:00 8 Apr 2011

Invite friends
Link copied!
No registration required unless stated otherwise