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MMC 2017: Understanding Radiation Beam-Damage during Cryo-, ETEM, Gas- and Liquid-Cell Electron Microscopy

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08:30 – 17:00 6 Aug 2017
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America's Center Convention Complex
St. Louis
Missouri
USA

Electron-beam induced radiation damage to gases, liquids, and vitrified ice is a technical problem for the electron microscopy (EM) study of natural and engineered structures as they exist in their ambient environments. This one-day congress is designed to provide insight into the processes that occur when a high-energy electron beam interacts with a material, its gas/liquid/solid embedding medium and the interfaces between them. Steady-state radiation conditions will be evaluated in terms of temperature variations, external probing, mass transport, and imaging modes for describing the reactive system.

Speakers will highlight the electron-dose threshold tolerances, low-LET ionizing radiation effects, damage mechanisms, prevention, and control of radiation effects for small volume environmental studies. The format will consist of invited presentations from radiation chemists and individuals with significant contributions to understanding electron-beam effects for environmental EM and in-situ x-rays cells.

The congress will feature a lunch-time poster session and a panel discussion to identify the major challenges going forward, and should be of interested to EM researchers in the areas of cryo-EM, ETEM, gas-cell EM and liquid-cell EM.

Organizers: Katherine Jungjohann, Sandia National Laboratories Taylor Woehl, University of Maryland Patricia Abellan, SuperSTEM Laboratory (UK)

Event type: Conference
Organised by: Microscopy & Microanalysis

http://microscopy.org/MandM/2017/program/congress.cfm


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Location icon
America's Center Convention Complex
St. Louis
Missouri
USA
Clock icon
08:30 – 17:00 6 Aug 2017
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